Transformer Parameter Extraction

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This Article by Steven M. Sandler and Danny Chow from AEi Systems describes how the Bode 100 is used to extract the parameters of a flyback transformer in order to create a wideband SPICE model.

In circuits with transformers the overall performance of the circuit is often dependent on the characteristics of the transformer itself. It can therefore be very important to fully characterize the used transformer.

This article shows how the Bode 100 is used to extract the transformer's parameters like primary and secondary inductance, leakage inductance, and losses.
The measured parameters are used to model the transformer characteristic over a wide frequency range.

About AEi
AEi Systems was established as Analytical Engineering in 1995 to support increasing demand for Worst Case Analysis in the Space market. AEi Systems' core strengths in circuit analysis and simulation allowed AEi Systems to expand into several areas of product design and development.

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Danny Chow is a Senior Engineering Specialist for AEi Systems, LLC He is responsible for reliability engineering analysis and bench testing operations.
Steve Sandler has been involved with power system engineering for nearly 40 years. Steve is the founder of Picotest.com, a company specializing in instruments and accessories for high performance power system and distributed system testing. He frequently lectures and leads workshops internationally on the topics of Power Integrity, PDN, and Distributed Systems and is a Keysight Certified EDA expert. Steve publishes articles and books related to power supply and PDN performance. His latest book, “Power Integrity: Measuring, Optimizing and Troubleshooting Power-Related Parameters in Electronics Systems” was published by McGraw-Hill in 2014. He is the recipient of the ACE 2015 Jim Williams Contributor of the Year ACE Award for his outstanding and continuing contributions to the engineering industry and knowledge sharing. Steve is also the founder of AEi Systems, a well-established leader in worst case circuit analysis, modeling, and troubleshooting of satellite and other high reliability systems.
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